Novel scanning microscope for visualization of individual emission sites on flat field emission cathodes

author: Vincenc Nemanič, Condensed Matter Physics, Jožef Stefan Institute
published: Feb. 12, 2008,   recorded: October 2007,   views: 159
Categories

Slides

Related Open Educational Resources

Related content

Report a problem or upload files

If you have found a problem with this lecture or would like to send us extra material, articles, exercises, etc., please use our ticket system to describe your request and upload the data.
Enter your e-mail into the 'Cc' field, and we will keep you updated with your request's status.
Lecture popularity: You need to login to cast your vote.
  Bibliography

Description

We present first results obtained by a novel scanning projection field emission microscope (SPFEM) designed to study flat broad-area field emission cathodes. The instrument merges capabilities of measuring the electron field emission current from an individual emitting site and genuine projection of electrons onto a luminescent screen. This is achieved by an optimized shape of the anode probe having a 0.04 mm aperture which generates an uniform macroscopic electric field across the investigated area of the cathode. This fact also enables presentation of the relation between the current density and the applied electric field. The magnification of the electron-optical system alone was calculated by computational modeling for some cathode – probe distances and for some voltages. The unique SPFEM performance is demonstrated on smooth sulfur doped nanodiamond films synthesized on molybdenum substrates.

See Also:

Download slides icon Download slides: slonano07_nemanic_nsm.ppt (2.3 MB)


Help icon Streaming Video Help

Link this page

Would you like to put a link to this lecture on your homepage?
Go ahead! Copy the HTML snippet !

Write your own review or comment:

make sure you have javascript enabled or clear this field: