Scanning Transmission Electron Microscopy: Applications in Materials Science

Published on 2013-12-185621 Views

Miran Čeh

Various Scanning Transmission Electron Microscopy (STEM) imaging techniques (ADF, HAADF, ABF) have become extremely useful for materials characterization at the nano- and atomic scale, particularly du

Kolokviji na Institutu "Jožef Stefan"

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Presentation

Scanning transmission electron microscopy (STEM): Applications in Materials Science00:00

Outline - 102:00

1 TEM vs STEM03:05

STEM Basics - 103:51

2. Signals in STEM04:15

STEM Basics - 204:44

3. detectors ADF, HAADF05:40

Annular Field Bright (ABF)06:36

4. Lens Aberrations07:13

STEM Basics - 307:30

Some names of aberrations08:06

Spherical Aberration08:42

STEM Basics - 409:24

5. Aberration correctors 10:06

Probe Corrector10:23

Cs Corrected beam profile10:56

6. Ronchigram11:26

Focusing with the Ronchigram11:49

The Electron Ronchigram in Cs corrected STEM12:15

Outline - 212:46

1. Microscopes for STEM imaging13:00

Experimental STEM13:25

2. Probe semi-angle (α) determination13:45

3. ADF, HAADF, ABF detector acceptance angles determination14:11

Experimetally determined values14:33

4. Specimen thickness14:39

5. Collection angles15:29

6. Processing of STEM images16:04

Processing of distortion free HR HAADF-STEM images17:02

IMAGE-WARP procedure17:18

7 Specimens for STEM/TEM observation18:24

Amorphous layer20:02

Outline - 320:34

1. Qualitative interpretation of HAADF-STEM images20:40

2. Quantitative HAADF-STEM21:46

Diffraction pattern22:37

Software for STEM image calculations23:12

3. Input structure data quality23:39

Comparison of different calculation procedures24:38

Defocus25:19

Outline - 425:34

1. AI-doped ZnO thin films26:08

Bright-field and high-angle STEM images of ZnO:AI26:40

2. Strained AIGaN/GaN superlattice27:11

Experimental bright-field STEM image27:49

Experimental HAADF-STEM imageof the SLS region28:21

Experimental HAADF-STEM image of the SLS cladding layer28:59

Average filtering of the experimental HAADF-STEM image of the SLS29:24

HAADF-STEM analysis-Results-Thickness determination29:39

3. 3 KTiO2(OH) channel structures29:58

4. CaTiO330:38

Defocus-thickness map - 131:38

Defocus-thickness map - 232:12

5. La(Ti,Mg)O3 - CaTiO3 solid solutions33:37

In thin region differences34:02

6. In2O3 - doped ZnO34:35

HRTEM of IB's35:32

HAADF of IB's - 136:04

HAADF of IB's - 236:50

HAADF vs ADF37:11

EDXS37:59

EDXS line profile38:38

7 SrONb2O - doped SrTiO3 thermoelectrics39:06

Two Sr(Ti Nb) O3 grains39:58

Single SrO planar faults40:24

HRTEM of RP faults40:36

HRSTEM of RP faults41:05

Ti, Nb, Sr41:27

X-ray mappings - 141:55

X-ray mappings - 243:03

8. Sr - hexaaluminate44:17

Experimental and Noise Filtered45:15

According to the Structures45:30

Conclusions46:25

Acknowledgements48:13