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ICML 2007 - The 24th Annual International Conference on Machine Learning
Pascal

Optimal Dimensionality of Metric Space for Classification

author: Xiangyang Xue, Fudan University

Description

For large-scale classification problems, the training samples can be clustered beforehand as a downsampling pre-process, and then only the obtained clusters are used for training. Motivated by such assumption, we proposed a classification algorithm, Support Cluster Machine (SCM), within the learning framework introduced by Vapnik. For the SCM, a compatible kernel is adopted such that a similarity measure can be handled not only between clusters in the training phase but also between a cluster and a vector in the testing phase. We also proved that the SCM is a general extension of the SVM with the RBF kernel. The experimental results confirm that the SCM is very effective for largescale classification problems due to significantly reduced computational costs for both training and testing and comparable classification accuracies. As a by-product, it provides a promising approach to dealing with privacy-preserving data mining problems.

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Slides
0:00 Optimal Dimensionality of Metric Space for kNN Classification
0:26 - Motivation
0:42 Related Work
1:30 Main Idea
2:41 - Proposed Algorithm
2:42 Setup
3:34 Objective Function
4:25 How to Compute P
5:20 What Does the Positive/Negative Eigenvalue Mean?
6:36 Choosing the Leading Negative Eigenvalues
7:22 Learned Mahalanobis Distance
7:50 - Experimental Results
7:50 Three Classes of Well Clustered Data
8:38 Two Classes of Data with Multimodal Distribution
9:21 Three Classes of Data
10:09 Five Classes of Non-Separable Data
10:40 UCI Sonar Dataset
12:17 Comparisons with the State-of-the-Art - 1
12:57 UMIST Face Database
13:44 Comparisons with the State-of-the-Art - 2
14:25 - Conclusions
14:27 Conclusions
15:17 Thanks for Your Attention! Any Questions?
15:18 - Questions

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