About
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
Course Homepage: 2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303)
Course features at MIT OpenCourseWare page: *Syllabus *Calendar *Readings *Assignments
Videos

Lecture 15: Response surface modeling and process optimization
Dec 14, 2010
·
3735 views

Lecture 4: Probability models of manufacturing processes
Dec 14, 2010
·
2630 views

Lecture 19: Case study 1: tungsten CVD DOE/RSM
Dec 14, 2010
·
2315 views

Control lab video
Feb 18, 2024
·
0 views

Lecture 22: Case study 4: "Modeling the Embossing/Imprinting of Thermoplastic La...
Dec 14, 2010
·
2188 views

Lecture 6: Sampling distributions and statistical hypotheses
Dec 14, 2010
·
2999 views

Lecture 14: Aliasing and higher order models
Dec 14, 2010
·
1970 views

Lecture 10: Yield modeling
Dec 14, 2010
·
2373 views

Lecture 11: Introduction to analysis of variance
Dec 14, 2010
·
3325 views

Lecture 21: Case study 3: spatial modeling
Dec 14, 2010
·
2271 views

Lecture 17: Nested variance components
Dec 14, 2010
·
2223 views

Lecture 3: Mechanical process variation — physical causes and interpreting data
Dec 14, 2010
·
2446 views

Lecture 2: Semiconductor process variation
Dec 14, 2010
·
3359 views

Lecture 20: Case study 2: cycle to cycle control
Dec 14, 2010
·
2370 views

Lecture 13: Modeling testing and fractional factorial models
Dec 14, 2010
·
2308 views

Lecture 7: Shewhart SPC and process capability
Dec 14, 2010
·
2854 views

Lecture 9: Advanced and multivariate SPC
Dec 14, 2010
·
2643 views

Lecture 5: Probability models, parameter estimation, and sampling
Dec 14, 2010
·
3817 views

Lecture 16: Process robustness
Dec 14, 2010
·
2251 views

Lecture 8: Process capability and alternative SPC methods
Dec 14, 2010
·
2540 views

Lecture 12 : Full factorial models
Dec 14, 2010
·
2353 views

Lecture 18: Sequential experimentation: "Experimentation and Robust Design and E...
Dec 14, 2010
·
2520 views

Lecture 1: Introduction — processes and variation framework
Dec 14, 2010
·
3017 views